Question · Q1 2026
Bradford Ferguson questioned the cost implications of waiting until the motherboard or packaged part stage for testing, compared to earlier stages like wafer-level testing, particularly in the context of expensive AI processors.
Answer
CEO Gayn Erickson emphasized the inefficiency of system-level testing and the benefits of shifting testing left to wafer-level. He highlighted the power efficiency and cost-effectiveness of Aehr's wafer-level burn-in solutions, as well as the feasibility of power infrastructure for high-volume testing.